Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions
Díaz Caballero, Elena
Boria, Vicente E.
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One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit